Publications

This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.

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44 results at Microelectronics Reliability

Reverse short channel effects in high-k gated nMOSFETs
- - J.-P. Han
  - S.M. Koo
  - et al.
- 2005
- Microelectronics Reliability
Testing of ultra low voltage VLSI chips using the superconducting single-photon detector (SSPD)
- - Franco Stellari
  - Peilin Song
- 2004
- Microelectronics Reliability
Reliability challenges with ultra-low k interlevel dielectrics
- - J.R. Lloyd
  - M. Lane
  - et al.
- 2004
- Microelectronics Reliability
Current crowding in faulty MOSFET: Optical and electrical investigation
- - A. Tosi
  - F. Stellari
  - et al.
- 2004
- Microelectronics Reliability
Time dependent dielectric breakdown in a low-k interlevel dielectric
- - J.R. Lloyd
  - E. Liniger
  - et al.
- 2004
- Microelectronics Reliability
Influence and model of gate oxide breakdown on CMOS inverters
- - R. Rodríguez
  - J.H. Stathis
  - et al.
- 2003
- Microelectronics Reliability
Latchup Analysis Using Emission Microscopy
- - Franco Stellari
  - Peilin Song
  - et al.
- 2003
- Microelectronics Reliability
Reliability of ultra-thin oxides in CMOS circuits
- - J.H. Stathis
  - B.P. Linder
  - et al.
- 2003
- Microelectronics Reliability
Circuit implications of gate oxide breakdown
- - J.H. Stathis
  - R. Rodríguez
  - et al.
- 2003
- Microelectronics Reliability
Backside flip-chip testing by means of high-bandwidth luminescence detection
- - A. Tosi
  - F. Stellari
  - et al.
- 2003
- Microelectronics Reliability