PaperUnique x-ray diffraction pattern at grazing incidence from misfit dislocations in SiGe thin filmsJ.L. Jordan-Sweet, P.M. Mooney, et al.Journal of Applied Physics
PaperStrain-relief mechanism in surfactant-grown epitaxial germanium films on Si(111)F.K. LeGoues, M. Horn-Von Hoegen, et al.Physical Review B
Conference paperCHARACTERIZATION OF IC DEVICES FABRICATED IN LOW TEMPERATURE (550 degree C) EPITAXY BY UHV/CVD TECHNIQUE.T.N. Nguyen, D.L. Harame, et al.IEDM 1985