John G. Long, Peter C. Searson, et al.
JES
Functional testing of rapid single-flux-quantum (RSFQ) logic circuits at high speed is necessary to further optimize circuit design, but it is not easy to do off-chip testing because of the high speed and small amplitude of SFQ pulses. This paper will present the design and test results of an 20 Gb/s bit-by-bit on-chip high-speed digital test system based on data-driven self-timed (DDST) circuits. © 1997 IEEE.
John G. Long, Peter C. Searson, et al.
JES
M.A. Lutz, R.M. Feenstra, et al.
Surface Science
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APS Global Physics Summit 2025
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Physical Review B