R.D. Murphy, R.O. Watts
Journal of Low Temperature Physics
The use of a dedicated chamber to perform pre-epi deposition cleaning allows native oxide removal with a low thermal budget, and significantly improves throughput of low-temperature Si and SiGe applications. Wafers processed in the cleaning chamber show no detectable contaminants, and the cleansed surface is actually significantly smoother because of cleaning down to a sub-angstrom level.
R.D. Murphy, R.O. Watts
Journal of Low Temperature Physics
D.D. Awschalom, J.-M. Halbout
Journal of Magnetism and Magnetic Materials
L.K. Wang, A. Acovic, et al.
MRS Spring Meeting 1993
Frank Stem
C R C Critical Reviews in Solid State Sciences