Frank Stem
C R C Critical Reviews in Solid State Sciences
The use of a dedicated chamber to perform pre-epi deposition cleaning allows native oxide removal with a low thermal budget, and significantly improves throughput of low-temperature Si and SiGe applications. Wafers processed in the cleaning chamber show no detectable contaminants, and the cleansed surface is actually significantly smoother because of cleaning down to a sub-angstrom level.
Frank Stem
C R C Critical Reviews in Solid State Sciences
Hiroshi Ito, Reinhold Schwalm
JES
I.K. Pour, D.J. Krajnovich, et al.
SPIE Optical Materials for High Average Power Lasers 1992
R.M. Macfarlane, R.L. Cone
Physical Review B - CMMP