Shaoning Yao, Wei-Tsu Tseng, et al.
ADMETA 2011
The use of a dedicated chamber to perform pre-epi deposition cleaning allows native oxide removal with a low thermal budget, and significantly improves throughput of low-temperature Si and SiGe applications. Wafers processed in the cleaning chamber show no detectable contaminants, and the cleansed surface is actually significantly smoother because of cleaning down to a sub-angstrom level.
Shaoning Yao, Wei-Tsu Tseng, et al.
ADMETA 2011
Q.R. Huang, Ho-Cheol Kim, et al.
Macromolecules
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
P. Martensson, R.M. Feenstra
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films