T.B. Light, J.M. Eldridge, et al.
Journal of Applied Physics
The density of vapor-deposited "amorphous" Ge was determined from x-ray-diffraction absorption measurements and found to be the same as the density of crystalline Ge within ±5%. © 1969 The American Physical Society.
T.B. Light, J.M. Eldridge, et al.
Journal of Applied Physics
R. Feder, T.B. Light
Journal of Applied Physics
K.C. Park, M. Berkenblit, et al.
Journal of Electronic Materials
J.W. Matthews, S. Mader, et al.
Journal of Applied Physics