Keith A. Jenkins, Lionel Li
VTS 2009
Modern e-beam probers may be as convenient to use as oscilloscopes, but their measurements can be misleading or even erroneous. The author warns of potential problems and suggests ways to prevent and cure faulty readings.
Keith A. Jenkins, Lionel Li
VTS 2009
Keith A. Jenkins, Scott E. Doyle
IEEE Circuits and Devices Magazine
Stas Polonsky, Keith A. Jenkins
IEEE Electron Device Letters
Tony Tae-Hyoung Kim, Pong-Fei Lu, et al.
IEEE Transactions on VLSI Systems