Embedded systems week
- Reinaldo A. Bergamaschi
- 2007
- IEEE Design and Test of Computers
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29 results at IEEE Design and Test of Computers
The dawn of predictive chip yield design: Along and beyond the memory lane
- Rajiv Joshi
- Rouwaida Kanj
- et al.
- 2010
- IEEE Design and Test of Computers
Compact modeling of variation in FinFET SRAM cells
- Darsen D. Lu
- Chung-Hsun Lin
- et al.
- 2010
- IEEE Design and Test of Computers
Reliability challenges and system performance at the architecture level
- Jude A. Rivers
- Prabhakar Kudva
- 2009
- IEEE Design and Test of Computers
Opportunities and challenges for 3D systems and their design
- Philip Emma
- Eren Kursun
- 2009
- IEEE Design and Test of Computers
On-chip testing techniques for RF wireless transceivers
- Alberto Valdes-Garcia
- Jose Silva-Martinez
- et al.
- 2006
- IEEE Design and Test of Computers
Quiescent-signal analysis: A multiple supply pad /DDQ method
- Jim Plusquellic
- Dhruva Acharyya
- et al.
- 2006
- IEEE Design and Test of Computers
Jitter measurements of high-speed serial links
- Marcel A. Marcel
- Martin L. Schmatz
- 2004
- IEEE Design and Test of Computers
Impact of design-manufacturing interface on SoC design methodologies
- Juan-Antonio Carballo
- Sani R. Nassif
- 2004
- IEEE Design and Test of Computers
Genesys-Pro: Innovations in test program generation for functional processor verification
- Allon Adir
- Eli Almog
- et al.
- 2004
- IEEE Design and Test of Computers