S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999
Dhdelectric characteristics were determined for a microstructurally anisotropic borosilicate glass prepared by uniaxiallhd stretching phase‐separated glass rods. The specimen showed a dielectric loss peak caused by the inhomogeneous microstructure; its magnitude varied with the orientation of the specimen with respect to the electric field direction. The results are in agreement with Sillars’ theory. Copyright © 1981, Wiley Blackwell. All rights reserved
S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999
J. Paraszczak, J.M. Shaw, et al.
Micro and Nano Engineering
G. Will, N. Masciocchi, et al.
Zeitschrift fur Kristallographie - New Crystal Structures
Sharee J. McNab, Richard J. Blaikie
Materials Research Society Symposium - Proceedings