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IEEE J-STARS
A technique is described whereby the direct observation of structural changes resulting from electrical switching can be followed in an electron microscope. It is applied to the amorphous chalcogenide alloys and a brief description of the filament that is formed is presented. © 1972.
Xikun Hu, Wenlin Liu, et al.
IEEE J-STARS
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SPIE Advanced Lithography 2010
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Physical Review B
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Microelectronic Engineering