A. Gangulee, F.M. D'Heurle
Thin Solid Films
Smeared transitions into low-T domain states are evidenced by linear birefringence measured on Srl-xCaxTiO3 at all concentrations, ˂0.002˂x˂0.058. Sharp E vs T peaks, as observed for x 0.016, may be explained by domains having nearly sample size. The local disorder due t o the Ca2+-induced random fields may pa rtially be removed by a uniform external electric field. © 1988, Taylor & Francis Group, LLC. All rights reserved.
A. Gangulee, F.M. D'Heurle
Thin Solid Films
Heinz Schmid, Hans Biebuyck, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Mark W. Dowley
Solid State Communications
F.J. Himpsel, T.A. Jung, et al.
Surface Review and Letters