Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
Secondary grain growth in vapor-deposited Al-Cu thin films has been investigated as a function of temperature, Cu concentration and distribution. Second phase Al2Cu particles were found to have a considerable effect in retarding secondary growth. Nuclei for secondary growth formed, presumably by rearrangement of misfit dislocations, only when Cu was introduced as a layer sandwiched between two equal Al layers. © 1972.
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
Julien Autebert, Aditya Kashyap, et al.
Langmuir
R.J. Gambino, N.R. Stemple, et al.
Journal of Physics and Chemistry of Solids
J. Tersoff
Applied Surface Science