Min Yang, Jeremy Schaub, et al.
Technical Digest-International Electron Devices Meeting
Secondary grain growth in vapor-deposited Al-Cu thin films has been investigated as a function of temperature, Cu concentration and distribution. Second phase Al2Cu particles were found to have a considerable effect in retarding secondary growth. Nuclei for secondary growth formed, presumably by rearrangement of misfit dislocations, only when Cu was introduced as a layer sandwiched between two equal Al layers. © 1972.
Min Yang, Jeremy Schaub, et al.
Technical Digest-International Electron Devices Meeting
Sharee J. McNab, Richard J. Blaikie
Materials Research Society Symposium - Proceedings
Xikun Hu, Wenlin Liu, et al.
IEEE J-STARS
Lawrence Suchow, Norman R. Stemple
JES