Sakti P. Ghosh
Information Systems
Paper
Dynamic statistical control of manufacturing test
Abstract
No abstract available.
Related
Sakti P. Ghosh
IEEE TKDE
Tore Dalenius, Sakti P. Ghosh
Technometrics
Sakti P. Ghosh
Information and Control
No abstract available.
Sakti P. Ghosh
Information Systems
Sakti P. Ghosh
IEEE TKDE
Tore Dalenius, Sakti P. Ghosh
Technometrics
Sakti P. Ghosh
Information and Control