Shu-Jen Han, Dharmendar Reddy, et al.
ACS Nano
The Helios compact synchrotron installed at IBM's Advanced Lithography Facility provides a unique opportunity to obtain compact synchrotron reliability data in an industrial environment. This paper presents data from the first eight months of user oriented operation of the machine. Running and uptime statistics are tabulated, as well as achieved performance parameters. Unscheduled downtime in the various subsystems is described. © 1993.
Shu-Jen Han, Dharmendar Reddy, et al.
ACS Nano
John G. Long, Peter C. Searson, et al.
JES
Ellen J. Yoffa, David Adler
Physical Review B
Hiroshi Ito, Reinhold Schwalm
JES