R.F. Voss, R.B. Laibowitz, et al.
IEEE Transactions on Magnetics
Measurements of the tunneling rate " out of the zero-voltage state for several Nb edge junctions with differing shunt capacitances are described. At zero temperature, increasing the shunt capacitance lowers " in agreement with dissipative calculations of the macroscopic-quantum-tunneling rate. As temperature increases, ln["(T)"(0)]T2 as recently predicted. © 1985 The American Physical Society.
R.F. Voss, R.B. Laibowitz, et al.
IEEE Transactions on Magnetics
E. Mendez, S. Washburn, et al.
ICPS Physics of Semiconductors 1984
K.Y. Lee, K. Ismail, et al.
Microelectronic Engineering
R.A. Webb, S. Washburn, et al.
Physica A: Statistical Mechanics and its Applications