Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
The uniaxial (basal plane) stress dependence of the charge-density wave ordering transformations in 2 H-TaSe2 are calculated from the recently reported elastic behavior and new measurements of the specific heat. Estimates of the expansivity behavior at these transitions are also given. © 1976 The American Physical Society.
Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
Lawrence Suchow, Norman R. Stemple
JES
T.N. Morgan
Semiconductor Science and Technology
Mark W. Dowley
Solid State Communications