Investigations of silicon nano-crystal floating gate memories
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
The results of a linear-elastic analysis to determine the phase angle at the tip of an interface crack in the peel test are presented in this paper. The phase angle is fairly insensitive to the peel angle and, when the film and substrate have identical elastic properties, the mode-I and mode-II components of the crack-tip stress field are approximately equal. The phase angle has some dependence on both the elastic mismatch and the applied force; it is very sensitive to any residual strains in the film. © 1992, Taylor & Francis Group, LLC. All rights reserved.
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
K.N. Tu
Materials Science and Engineering: A
Douglass S. Kalika, David W. Giles, et al.
Journal of Rheology