Electromigration and transport reversal in copper-silver thin films

Abstract

Grain boundary electrotransport of copper and silver atoms in copper + 1·2 at.% silver thin film conductors has been found to take place in opposite directions; the copper atoms migrate against the direction of electron flow, while the silver atoms migrate along this direction. It is shown that both the transport directions of the copper and the silver atoms can be qualitatively interpreted in terms of the existing theories of electromigration. © 1974 Peragamon Press.