Vladimir Yanovski, Israel A. Wagner, et al.
Ann. Math. Artif. Intell.
Conference paper
Electromigration-dependent parametric yield estimation
Abstract
We define and investigate the problem of electromigration faults caused by spot defects during VLSI manufacturing process. Analysis is given for a simple layout, and simulations are presented and discussed for a more complicated case. It is shown that in some cases, electromigration-dependent parametric faults can make a significant contribution to the total yield estimation. ©2004 IEEE.
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