V. Foglietti, W.J. Gallagher, et al.
Applied Physics Letters
A model is constructed where a nonequilibrium vacancy concentration resulting from electromigration-induced mass flux divergences is responsible for damage in the form of wedge-like and/or crack-like voids as well as thinning of extended areas. The damage morphology is primarily a function of temperature.
V. Foglietti, W.J. Gallagher, et al.
Applied Physics Letters
S. Ingvarsson, L. Ritchie, et al.
Physical Review B - CMMP
R.H. Koch, J.R. Rozen
Applied Physics Letters
R.H. Koch, V. Foglietti, et al.
Applied Physics Letters