S. Ingvarsson, L. Ritchie, et al.
Physical Review B - CMMP
A model is constructed where a nonequilibrium vacancy concentration resulting from electromigration-induced mass flux divergences is responsible for damage in the form of wedge-like and/or crack-like voids as well as thinning of extended areas. The damage morphology is primarily a function of temperature.
S. Ingvarsson, L. Ritchie, et al.
Physical Review B - CMMP
M. Scheuermann, C.C. Chi, et al.
Applied Physics Letters
J.P. Pelz, R.H. Koch
Review of Scientific Instruments
A. Hartstein, R.H. Koch
ICNN 1987