Conference paper
Performance test case generation for microprocessors
Pradip Bose
VTS 1998
This paper discusses the engineering of electron-beam sys tems for the generation of micron and submicron lithography. Design objectives and options for the electron-beam column, X-Y workpiece stage, laser interferometer, pattern generator, software, and general engineering are the major topics. Copyright © 1983 by The Institute of Electrical and Electronics Engineers, Inc.v
Pradip Bose
VTS 1998
Anupam Gupta, Viswanath Nagarajan, et al.
Operations Research
Raghu Krishnapuram, Krishna Kummamuru
IFSA 2003
David S. Kung
DAC 1998