PaperSiO2 film decomposition reaction initiated by carbon impurities located at a Si-SiO2 interfaceS.I. Raider, S.R. Herd, et al.Applied Physics Letters
PaperNucleation of small metal particles on ultrathin SiO2 films on SiL. Kasprzak, R.B. Laibowitz, et al.Thin Solid Films
PaperRapid thermal annealing of boron-implanted silicon using an ultrahigh power arc lampR.T. Hodgson, V.R. Deline, et al.Applied Physics Letters
PaperStructure of the Amorphous Alloy (Ag + SO at.-% Cu)G. Breitling, S. Mader, et al.Zeitschrift fur Naturforschung - Section A Journal of Physical Sciences
