PaperThermal stability of silicide on polycrystalline SiQ.Z. Hong, Stella Q. Hong, et al.Thin Solid Films
PaperElectromigration of Ni in Al thin-film conductorsF.M. D'Heurle, A. Gangulee, et al.Journal of Applied Physics
PaperElectron diffraction from optical gratings and latex spheresS. Mader, S.R. HerdJournal of Applied Physics
PaperThermal expansion of the isostructural PtSi and NiSi: Negative expansion coefficient in NiSi and stress effects in thin filmsC. Detavernier, C. Lavoie, et al.Journal of Applied Physics
