Frank Stem
C R C Critical Reviews in Solid State Sciences
Direct experimental evidence for the existence of electron-hole drops in Si has been obtained from the current pulses produced when they dissociate in the high electric field of a p-n junction. From these results we also determine the drop radius, which is typically about 0.75 μ in this experiment. © 1975.
Frank Stem
C R C Critical Reviews in Solid State Sciences
Shu-Jen Han, Dharmendar Reddy, et al.
ACS Nano
Peter J. Price
Surface Science
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007