William Hinsberg, Joy Cheng, et al.
SPIE Advanced Lithography 2010
Direct experimental evidence for the existence of electron-hole drops in Si has been obtained from the current pulses produced when they dissociate in the high electric field of a p-n junction. From these results we also determine the drop radius, which is typically about 0.75 μ in this experiment. © 1975.
William Hinsberg, Joy Cheng, et al.
SPIE Advanced Lithography 2010
T.N. Morgan
Semiconductor Science and Technology
J.K. Gimzewski, T.A. Jung, et al.
Surface Science
Douglass S. Kalika, David W. Giles, et al.
Journal of Rheology