On the dynamic resistance and reliability of phase change memory
B. Rajendran, M.H. Lee, et al.
VLSI Technology 2008
X-ray photoemission spectra (XPS) and Raman measurements of Y1-xEuxBa2Cu3O7 and Eu1-xPrxBa2Cu3O7 are compared to those of Y1-xPrxBa2Cu3O7. It is shown that, with increasing x, the binding energies of the Ba core levels of Eu1-xPrxBa2Cu3O7 shift towards higher values as in Y1-xPrxBa2Cu3O7, while those of Y1-xEuxBa2Cu3O7 do not, despite similar changes in Ba-O interatomic distances in the latter two systems. Raman measurements of Y1-xPrxBa2Cu3O7 show a frequency increase of the Ba and apical-oxygen modes with increasing x, but a much smaller frequency increase in Y1-xEuxBa2Cu3O7. The XPS and Raman results reflect changes in the Ba-O hybridization and correlate with both the suppression of superconductivity in both Y1-xPrxBa2Cu3O7 and Eu1-xPrxBa2Cu3O7, and with the retention of superconductivity in Y1-xEuxBa2Cu3O7. © 1991 The American Physical Society.
B. Rajendran, M.H. Lee, et al.
VLSI Technology 2008
Sang-Min Park, Mark P. Stoykovich, et al.
Advanced Materials
Oliver Schilter, Alain Vaucher, et al.
Digital Discovery
Dipanjan Gope, Albert E. Ruehli, et al.
IEEE T-MTT