Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
A large enhancement of the parametrically generated backward-propagating elastic wave in Si: In is reported. The enhancement is observed when the nonlinear interaction between microwave electric and elastic fields occurs at the interface between the Si sample and the sputtered thin-film ZnO ultrasonic transducer. Phase and spectral information is presented. No satisfactory mechanism for the enhancement is known. © 1982 The American Physical Society.
Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
O.F. Schirmer, K.W. Blazey, et al.
Physical Review B
A. Ney, R. Rajaram, et al.
Journal of Magnetism and Magnetic Materials
I. Morgenstern, K.A. Müller, et al.
Physica B: Physics of Condensed Matter