A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
Results are presented detailing the crystallographic quality of a number of metal films deposited by epitaxial sputter deposition. Such films have single-orientation f.c.c., h.c.p., b.c.c. and hybrid crystal structures, and include the elements Ag, Au, Co, Cr, Cu, Fe, Rh, Ru, Pd and V. The crystal structure was characterized using X-ray diffraction analysis.
A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
O.F. Schirmer, W. Berlinger, et al.
Solid State Communications
J.C. Marinace
JES
Gregory Czap, Kyungju Noh, et al.
APS Global Physics Summit 2025