L. Krusin-Elbaum, T. Shibauchi, et al.
Journal of Magnetism and Magnetic Materials
The authors present direct evidence for Te segregation to the grain boundaries in chalcogenide Ge2 Sb2 Te5 films by using transmission electron microscopy scans with a 0.5 nm diameter focused probe. This finding is consistent with the observed impeded grain growth and with the post-transition relief of a "spikelike" stress, fully to the pretransition level. Te motion shows up in void formation below 200 °C, a pileup of Te at the surface and its loss at higher (above 400 °C) temperatures. Tuning the driving force for this segregation may be key for the optimal phase-change material design. © 2007 American Institute of Physics.
L. Krusin-Elbaum, T. Shibauchi, et al.
Journal of Magnetism and Magnetic Materials
T. Shibauchi, L. Krusin-Elbaum, et al.
Physica C: Superconductivity and its Applications
L. Krusin-Elbaum, G. Blatter, et al.
Physical Review Letters
Y. Yeshurun, A.P. Malozemoff, et al.
Cryogenics