J. Jang, Sangsu Park, et al.
IEEE Electron Device Letters
The initial evolution of FDTD into a tool for optimizing (not just verifying) nanophotonics device designs is described. Parallelization to multiple computers and FDTD features allowing reasonable accuracy even with coarse gridding are described. © 2003 Optical Society of America.
J. Jang, Sangsu Park, et al.
IEEE Electron Device Letters
Jaione Tirapu Azpiroz, Geoffrey W. Burr, et al.
SPIE Advanced Lithography 2008
Rohit S. Shenoy, Geoffrey W. Burr, et al.
Semiconductor Science and Technology
Geoffrey W. Burr, Bülent N. Kurdi, et al.
IBM J. Res. Dev