C. Lavoie, C. Cabral Jr., et al.
Defect and Diffusion Forum
Multilayer films of [Co 10 Å/Cu(t)]64 with copper thicknesses from t=10 to 29 Å annealed for 1 h at temperatures about 350°C showed a decrease in sample resistivity at 4.2 K. The giant magnetoresistance (GMR) maximums for as-deposited films at t=10 Å and t=23 Å shifted with annealing. The GMR decreased for t=10 Å and t=23 Å but increased for t=19 Å and t=29 Å indicating a complex behavior with annealing. Similarities with granular films are discussed.
C. Lavoie, C. Cabral Jr., et al.
Defect and Diffusion Forum
S.-E. Hörnström, T. Lin, et al.
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
L. Gignac, V. Svilan, et al.
MRS Fall Meeting 1996
T.R. McGuire, D. Dimas, et al.
IEEE Transactions on Magnetics