Xikun Hu, Wenlin Liu, et al.
IEEE J-STARS
Grain growth in vapor-deposited 81 at.% Ni+19 at.% Fe thin films 200 and 400 Å thick in the temperature range 350°-450°C has been investigated by transmission electron microscopy. The results have been interpreted in terms of a previously published model of grain growth in thin films on substrates. The activation energy for grain growth in this alloy has been determined as 1.7±0.2 eV. © 1974.
Xikun Hu, Wenlin Liu, et al.
IEEE J-STARS
Julian J. Hsieh
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Sung Ho Kim, Oun-Ho Park, et al.
Small
Ming L. Yu
Physical Review B