Microscopy and Microanalysis

Paper

24 Jul 2003

High resolution spectrometer coupling to the sub-Å IBM STEM

Abstract

No abstract available.

Related

Paper

Damping of bulk plasmons in small aluminum spheres

Paper

Atomic resolution EELS analysis of a misfit dislocation at a GeSi/Si interface

Paper

Structural studies on small areas using stem

Paper

Examination of flatband and threshold voltage tuning of HfO₂/TiN field effect transistors by dielectric cap layers

View all publications