Conference paper
Aberration correction results in the IBM STEM instrument
P.E. Batson
Ultramicroscopy
No abstract available.
P.E. Batson
Ultramicroscopy
T.S. Kuan, P.E. Batson, et al.
IBM J. Res. Dev
P.E. Batson
Ultramicroscopy
P.E. Batson, J. Bruley
Physical Review Letters