R.D. Miller, R. Beyers, et al.
MRS Spring Meeting 1999
Thin films of YBa2Cu3O7-x were deposited on Si substrates at 600-700°C by dc magnetron sputtering from a stoichiometric oxide target. Resistivity measurement results indicate that these films are superconducting with a zero resistance Tc as high as 76 K, without further high-temperature post-annealing treatments. These films give both core and valence-band x-ray photoemission, and x-ray diffraction spectra similar to those for superconducting films prepared with a high-temperature post-annealing step. No significant diffusion of Si from the substrate into the film was detected for the films deposited at 650°C or lower, according to depth profiles obtained using secondary ion mass spectrometry.
R.D. Miller, R. Beyers, et al.
MRS Spring Meeting 1999
B.T. Ahn, V.Y. Lee, et al.
Physica C: Superconductivity and its applications
R.D. Miller, J.C. Scott, et al.
ACS National Meeting 1997
J.B. Torrance, J.J. Mayerle, et al.
JACS