A. Portavoce, M. Kammler, et al.
Nanotechnology
Low-energy electron microscopy (LEEM) is a relatively new technique for real-time imaging of surfaces. Lateral resolution is in the 150 Å range and single-height atomic steps can be observed. In this paper we describe how to set up a low-energy electron microscope and obtain images in the different imaging modes. © 1993.
A. Portavoce, M. Kammler, et al.
Nanotechnology
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Physical Review B
S. Kodambaka, F.M. Ross, et al.
MRS Fall Meeting 2006
M. Copel, R.M. Tromp
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