F.M. Ross, J. Tersoff, et al.
Microscopy Research and Technique
Low-energy electron microscopy (LEEM) is a relatively new technique for real-time imaging of surfaces. Lateral resolution is in the 150 Å range and single-height atomic steps can be observed. In this paper we describe how to set up a low-energy electron microscope and obtain images in the different imaging modes. © 1993.
F.M. Ross, J. Tersoff, et al.
Microscopy Research and Technique
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Physical Review Letters
F.M. Ross, M. Kammler, et al.
Philosophical Magazine
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Applied Physics Letters