E.A. Stachf, R. Hull, et al.
Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
Low-energy electron microscopy (LEEM) is a relatively new technique for real-time imaging of surfaces. Lateral resolution is in the 150 Å range and single-height atomic steps can be observed. In this paper we describe how to set up a low-energy electron microscope and obtain images in the different imaging modes. © 1993.
E.A. Stachf, R. Hull, et al.
Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
R.M. Tromp, W. Theis, et al.
Physical Review Letters
S. Kodambaka, J. Tersoff, et al.
Science
A. Portavoce, M. Kammler, et al.
Nanotechnology