Aberration correction results in the IBM STEM instrument
- P.E. Batson
- 2003
- Ultramicroscopy
Publications
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.
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126 results at Ultramicroscopy
Artifacts in aberration-corrected ADF-STEM imaging
- Zhiheng Yu
- Philip E. Batson
- et al.
- 2003
- Ultramicroscopy
Advanced spatially resolved EELS in the STEM
- P.E. Batson
- 1999
- Ultramicroscopy
Extracting transverse electron mean free paths in graphene at low energy
- Peter S. Neu
- Daniël Geelen
- et al.
- 2023
- Ultramicroscopy
Gun energy filter for a low energy electron microscope
- Rudolf M. Tromp
- James B. Hannon
- et al.
- 2023
- Ultramicroscopy
Low energy electron microscopy at cryogenic temperatures
- Arash Tebyani
- Sebastian Schramm
- et al.
- 2023
- Ultramicroscopy
Back illuminated photo emission electron microscopy (BIPEEM)
- Amin Moradi
- Matthijs Rog
- et al.
- 2023
- Ultramicroscopy
Complementary LEEM and eV-TEM for imaging and spectroscopy
- Peter S. Neu
- Daniël Geelen
- et al.
- 2021
- Ultramicroscopy
Aberration corrected spin polarized low energy electron microscope
- Lei Yu
- Weishi Wan
- et al.
- 2020
- Ultramicroscopy
Quantitative analysis of spectroscopic low energy electron microscopy data: High-dynamic range imaging, drift correction and cluster analysis
- T. A. de Jong
- D. N.L. Kok
- et al.
- 2020
- Ultramicroscopy