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PaperMicrostructural origin of orientation ratio in magnetic recording mediaMichael F. Toney, Ernesto E. Marinero, et al.Journal of Applied Physics
PaperUnderstanding stress gradients in microelectronic metallizationConal E. Murray, E. Todd Ryan, et al.Powder Diffraction
PaperObservation of the effect of refraction on x rays diffracted in a grazing-incidence asymmetric Bragg geometryMichael F. Toney, Sean BrennanPhysical Review B
