Microscopy and Microanalysis

Paper

01 Aug 2002

In situ transmission electron microscopy of copper electrodeposition

Abstract

No abstract available.

Paper

Charge Catastrophe and Dielectric Breakdown during Exposure of Organic Thin Films to Low-Energy Electron Radiation

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Physical Review Letters

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A unique tool for imaging crystal growth

Frances M. Ross

Materials Today

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Growth and characterization of epitaxial Si/(La_xY_1-x)₂O₃/Si heterostructures

Vijay Narayanan, Supratik Guha, et al.

Journal of Applied Physics

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Quantitative analysis of spectroscopic low energy electron microscopy data: High-dynamic range imaging, drift correction and cluster analysis

T. A. de Jong, D. N.L. Kok, et al.

Ultramicroscopy

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