Imaging of oxide and interface charges in SiO2-Si
R. Ludeke, E. Cartier
Microelectronic Engineering
Smooth films of n-In1-xGaxAs and p-GaSb 1-yAsy were grown by molecular beam epitaxy. As a function of the compositions, x and y, the lattice constants vary linearly while the energy gaps show a downward bowing. Abrupt heterojunctions made of these alloys with close lattice matching exhibit a series of current-voltage characteristics which change from rectifying to Ohmic as x and y are reduced. The relative location of the band-edge energies of the two semiconductors at the interface is shown to account for the unusual characteristics observed experimentally.
R. Ludeke, E. Cartier
Microelectronic Engineering
R. Ludeke, A. Koma
Physical Review Letters
Benjamin Rockwell, H.R. Chandrasekhar, et al.
Surface Science
H. Bluyssen, J.C. Maan, et al.
Solid State Communications