H. Seki, T.J. Chuang, et al.
Physical Review B
An atomic-force microscope was used to measure the surface forces between a sharp tungsten tip and several different types of molecularly thin organic films on a silicon substrate. The forces are dramatically influenced by the molecular films covering the surfaces. The films investigated fall into three categories: liquid for unbound films of perfluoropolyether, intermediate for bonded films of perfluoropolyether, and soft solid for multilayers of cadmium arachidate. Molecular-level origins of these forces are discussed. © 1990 The American Physical Society.
H. Seki, T.J. Chuang, et al.
Physical Review B
M.R. Philpott, P.M. Grant, et al.
The Journal of Chemical Physics
Kevin Ashley, Mahesh G. Samant, et al.
Journal of Electroanalytical Chemistry
Kevin Ashley, Mark Lazaga, et al.
Surface Science