PaperTheory of thin-film orientation by ion bombardment during depositionR. Mark Bradley, James M. E. Harper, et al.Journal of Applied Physics
PaperSummary abstract: Theory of thin-film orientation by ion bombardment during depositionR. Mark Bradley, James M.E. Harper, et al.Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
PaperElectron microscopy of the grain structure of metal films and linesDavid A. Smith, Martin Small, et al.Ultramicroscopy