Ellen J. Yoffa, David Adler
Physical Review B
We report on the interfacial intermixing of ultrathin Co films on a Cu(001) single crystal, two materials that are immiscible in the bulk. With increasing deposition rate we find a crossover from layer-by-layer to bilayer growth due to a hindered diffusion from the first layer to the substrate. Above two monolayers, growth proceeds in a layer-by-layer fashion. These effects are explained in terms of surface free energies. © 1997 Elsevier Science B.V.
Ellen J. Yoffa, David Adler
Physical Review B
Mark W. Dowley
Solid State Communications
Biancun Xie, Madhavan Swaminathan, et al.
EMC 2011
J.K. Gimzewski, T.A. Jung, et al.
Surface Science