M.H. Brodsky, R.J. Gambino, et al.
physica status solidi (b)
Optical and Hall effect measurements on thin film layers of polycrystalline IrSi1.75 show that this material is a semiconductor. The band gap is approximately 1.2 eV. The films obtained saturated with silicon were p-type with a charge carrier density of the order of 4×1017 cm -3.
M.H. Brodsky, R.J. Gambino, et al.
physica status solidi (b)
D.P. Divincenzo, J. Bernholc, et al.
Physical Review B
M.H. Brodsky, G. Lucovsky, et al.
Physical Review B
J.E. Smith Jr., M.H. Brodsky, et al.
Journal of Non-Crystalline Solids