A. Deneuville, M.H. Brodsky
Thin Solid Films
Optical and Hall effect measurements on thin film layers of polycrystalline IrSi1.75 show that this material is a semiconductor. The band gap is approximately 1.2 eV. The films obtained saturated with silicon were p-type with a charge carrier density of the order of 4×1017 cm -3.
A. Deneuville, M.H. Brodsky
Thin Solid Films
J.E.E. Baglin, F.M. D'Heurle, et al.
Nuclear Instruments and Methods
M.H. Brodsky, G. Lucovsky
Physical Review Letters
J.E.E. Baglin, F.M. D'Heurle, et al.
Applied Physics Letters