M. Grimsditch, W. Senn, et al.
Solid State Communications
Optical and Hall effect measurements on thin film layers of polycrystalline IrSi1.75 show that this material is a semiconductor. The band gap is approximately 1.2 eV. The films obtained saturated with silicon were p-type with a charge carrier density of the order of 4×1017 cm -3.
M. Grimsditch, W. Senn, et al.
Solid State Communications
D.J. Wolford, B.A. Scott, et al.
Physica B+C
H. Mell, M.H. Brodsky
Thin Solid Films
G. Lucovsky, M.H. Brodsky, et al.
Physical Review B