Conference paper
RStore: A Direct-Access DRAM-based Data Store
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ICDCS 2015
Jitter is one of the most important issues in the design and operation of high-speed serial links. This article focuses on the BERT scan method, a jitter characterization method based on scanning the bit-error rate within the eye diagram. © 2004 IEEE.
Animesh Trivedi, Patrick Stuedi, et al.
ICDCS 2015
Thomas Toifl, Christian Menolfi, et al.
IEEE Journal of Solid-State Circuits
Jonas R. M. Weiss, Marcel A. Kossel, et al.
ISSCC 2006
Thomas Toifl, Christian Menolfi, et al.
IEEE Journal of Solid-State Circuits