O.F. Schirmer, K.W. Blazey, et al.
Physical Review B
Kronig-Penney-type calculations were used to evaluate the tunneling probability through a thin disordered dielectric film between two metallic electrodes. Our calculations indicate that the tunneling probability increases with increasing disorder. © 1972.
O.F. Schirmer, K.W. Blazey, et al.
Physical Review B
K.N. Tu
Materials Science and Engineering: A
T. Schneider, E. Stoll
Physical Review B
William Hinsberg, Joy Cheng, et al.
SPIE Advanced Lithography 2010