Andreas C. Cangellaris, Karen M. Coperich, et al.
EMC 2001
Kronig-Penney-type calculations were used to evaluate the tunneling probability through a thin disordered dielectric film between two metallic electrodes. Our calculations indicate that the tunneling probability increases with increasing disorder. © 1972.
Andreas C. Cangellaris, Karen M. Coperich, et al.
EMC 2001
Sang-Min Park, Mark P. Stoykovich, et al.
Advanced Materials
F.J. Himpsel, T.A. Jung, et al.
Surface Review and Letters
R.M. Macfarlane, R.L. Cone
Physical Review B - CMMP