Designing a testable System on a Chip
S.V. Kosonocky, A.A. Bright, et al.
VTS 1998
An experimental investigation has indicated that the ε-phase Pb-Bi alloy is an attractive alternative to Pb-1.7 wt.% Au for use as a counterelectrode for Josephson tunneling devices containing Pb-12 wt.% In-4 wt.% Au alloy films as base electrodes and control lines. Use of this Pb-Bi alloy as a counterelectrode results in a significant improvement in junction quality; the normalized subgap single-particle tunneling current is ∼2× lower at 2 mV. In addition, devices with the Pb-Bi counterelectrodes exhibit ∼3× fewer failures after repeated thermal cycling between 300 and 4.2°K. Out ot a total of 72 such devices having large area (6.2×10-6 cm2) junctions, 94% survived 1000 thermal cycles with negligible change.
S.V. Kosonocky, A.A. Bright, et al.
VTS 1998
S.K. Lahiri
Thin Solid Films
S.K. Lahiri, S. Basavaiah
Journal of Applied Physics
S. Basavaiah, J.H. Greiner
Journal of Applied Physics