C.W. Drake, V.W. Hughes, et al.
Physical Review
It is shown that photoionization cross sections in the soft-x-ray region can be determined accurately with proton-induced x-ray spectroscopy. A film of the absorber is evaporated onto a substrate. The characteristic substrate radiation, generated with a proton beam, is measured with and without the absorber. The ionization cross section can then be calculated after a small and often negligible correction is made for the intensity change of the substrate radiation due to the energy loss of the proton beam passing through the absorber.
C.W. Drake, V.W. Hughes, et al.
Physical Review
D.J. DiMaria, W. Reuter, et al.
Journal of Applied Physics
A. Khadjavi, W. Happer Jr., et al.
Physical Review Letters
B. Budick, R. Novick, et al.
Applied Optics