S. Ingvarsson, L. Ritchie, et al.
Physical Review B - CMMP
The low-field magnetoresistance (MR) properties of polycrystalline La0.67Sr0.33MnO3 and La0.67CaO33MnO3 thin films with different grain sizes have been investigated and compared with epitaxial films. MR as high as 15% has been observed in the polycrystalline films at a field of 1500 Oe at low temperatures, whereas the MR of the epitaxial films is less than 0.3% in the same field range. Based on the magnetization dependence of the MR, the current-voltage characteristics, and the temperature dependence of the resistivity, we attribute the low-field MR to spin-dependent scattering of polarized electrons at the grain boundaries which serve as pinning centers for the magnetic domain walls. © 1997 American Institute of Physics.
S. Ingvarsson, L. Ritchie, et al.
Physical Review B - CMMP
A. Gupta, T.R. McGuire, et al.
Applied Physics Letters
A.G. Schrott, J.A. Mishwich, et al.
Materials Research Society Symposium - Proceedings
M.Y. Chern, A. Gupta, et al.
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films