B. Reihl, B.I. Dunlap
Applied Physics Letters
We describe a new scanning tunneling microscope designed specifically for use in an ultra-high-vacuum low-temperature environment. The concept is based on an instrument with interchangeable tip, probe, and a remotely manipulated STM head. The instrumental performance and initial images of a Au(110)(1×2) reconstructed surface obtained with atomic resolution at T ≈ 10 K are presented. © 1992.
B. Reihl, B.I. Dunlap
Applied Physics Letters
J.K. Gimzewski, R. Berndt, et al.
Ultramicroscopy
K.O. Magnusson, B. Reihl
Physical Review B
B. Reihl, N. Mårtensson, et al.
Physical Review Letters