Y.H. Lee, K.L. Wang, et al.
physica status solidi (a)
Strained Si devices exhibit enhanced carrier mobility compared to that of standard Si CMOS devices of the same dimensions. Recent strained Si CMOS device results are reviewed. Materials issues related to the strained Si/relaxed SiGe heterostructures required for a strained Si CMOS technology are discussed.
Y.H. Lee, K.L. Wang, et al.
physica status solidi (a)
E. Calleja, P.M. Mooney, et al.
Applied Physics Letters
I. Lagnado, P.R. De La Houssaye, et al.
SiRF 2000
P.M. Mooney
Journal of Applied Physics