S.J. Koester, R. Hammond, et al.
IEEE Electron Device Letters
The measured temperature and supply voltage dependences of a bandgap reference circuit first published by Gilbert and implemented in IBM's SiGe BiCMOS process agree well with model predictions. The plot of VBGR against temperature exhibits less curvature than predicted elsewhere for SiGe BGRs.
S.J. Koester, R. Hammond, et al.
IEEE Electron Device Letters
S.J. Koester, R. Hammond, et al.
DRC 2000
A. Rylyakov, J. Tierno, et al.
ISSCC 2008
D.L. Rogers, S. Walker, et al.
SPIE Photonics West 1995