Measurements of conductivity near the metal-insulator critical point

Paper

15 Mar 1983

Abstract

We present measurements of the electrical conductivity at low temperatures of bulk samples of Si

Conference paper

Corneliu Constantinescu

SPIE Optical Engineering + Applications 2009

Paper

Michael Ray, Yves C. Martin

Proceedings of SPIE - The International Society for Optical Engineering

Paper

Frank Stem

C R C Critical Reviews in Solid State Sciences

Paper

K.A. Chao

Physical Review B